>> P.248
*1Accuracyinspectionenvironment:Temperature20℃±1℃,Humidity50%RH±10%RHMeasurementworkpieces:Specifiedreferenceballforinspection(ф25mm)21.2°Inspectionmethod:DeterminedbyMitutoyo-specifiedinspectionmethod.Theoperatingenvironmentandthestorageenvironmentaredifferentfromtheguaranteedaccuracyenvironment.*2Measuringaccuracymaydeteriorateifanywaterdropletordustparticleadherestotheopticalpath.18.512408074Non-contactLine-laserSensorSurfaceMeasure1008S•Thesensorisguaranteedforscanningerrorof20µm(1σ)andaZaxisrepeatabilityof0.5µm.Inaddition,ithasachievedtheIP67protectionlevel,providingstablemeasurements.•TheSurfaceMeasure1008Scanobtainthetwo-dimensionalandthree-dimensionalshapesofmeasurementworkpiecesathighspeed(amaximumframerateof10kHz)andmakeanautomaticjudgementinsidethesensor.•Itisequippedwithapartsmatchingfunctionthatallowsthemeasurementtooltobeappliedthroughout,regardlessoftheorientationsofthepartsbeingmeasured.Measurementscanbetakenwithoutperformingalignment.•Thesoftwaresupportsintuitiveoperationandisbuiltintothesensor(softwareinstallationisnotrequired),soyoucanuseitimmediatelyaftermounting.SpecificationsOrderNo.MaximummeasuringwidthMeasuringrangeWorkingdistanceScanningerror(1σ)*1ZaxisrepeatabilityFramerateLaserclassLinelaserMassOperatingenvironmentStorageenvironmentLasermediumWavelengthMax.outputTemperatureHumidityTemperatureHumidityIPcodePowersupply(powerconsumption)553-100100mm80mm80mm20µm(Spheremeasurement)0.5µmMax.10kHzEN/IECCLASS2IEC60825-1:2014,EN60825-1:2014+A11:2021CLASS2(JISC6802:2014)JISSemiconductorlaser405nm(visible)2.2mW650g0℃to40℃RH20to80%,non-condensing-30℃to70℃RH20to95%,non-condensingIP67*224to48VDC(15W)Unit:mm10040Mountingsize3×M4depth4.7DimensionsMeasuringrange3456.5805711920131248011081234616152×Ø4.420304×M3depth3.521.2°1218.548741004040801920131248011081234616152×Ø4.453×M4depth4.7204×M3depth3.56-3
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